Robert Mroczyński

Years Active: 2020-2023
Publications (10 Years): 5

Warsaw University of Technology

Warsaw University of Technology (PHD)

This page only lists publications with an associated author ORCID identifier.

Affiliation History

Warsaw University of Technology Apr 01 2018

Poland

Associate Professor :: Faculty of Electronics and Information Technologies

Warsaw University of Technology Oct 01 2008 - Mar 31 2018

Poland

Assistant Professor :: Faculty of Electronics and Information Technologies

Kyungpook National University

South Korea

Visiting Professor

University of Michigan College of Engineering Oct 01 2011 - Apr 30 2012

United States

Visiting Assistant Research Scientist :: Department Engineering and Computer Science

Warsaw University of Technology Oct 01 2007 - Sep 30 2008

Poland

Assistant :: Faculty of Electronics and Information Technologies

Education History

Warsaw University of Technology Sep 01 2003 - Jun 30 2008

Poland

PHD :: Faculty of Electronics and Information Technologies

Warsaw University of Technology Feb 01 2002 - Jun 30 2003

Poland

MSC :: Faculty of Electronics and Information Technologies

Warsaw University of Technology Feb 01 1998 - Jan 31 2002

Poland

BSC :: Faculty of Electronics and Information Technologies

Publications

Mirosław Puźniak, Wojciech Gajewski, Aleksandra Seweryn, Marcin T Klepka, Bartlomiej S Witkowski, Marek Godlewski, Robert Mroczyński
Studies of Electrical Parameters and Thermal Stability of HiPIMS Hafnium Oxynitride (HfO x N y ) Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Mirosław Puźniak, Wojciech Gajewski, Aleksandra Seweryn, Marcin T Klepka, Bartlomiej S Witkowski, Marek Godlewski, Robert Mroczyński
Studies of Electrical Parameters and Thermal Stability of HiPIMS Hafnium Oxynitride (HfO x N y ) Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Mirosław Puźniak, Wojciech Gajewski, Aleksandra Seweryn, Marcin T Klepka, Bartlomiej S Witkowski, Marek Godlewski, Robert Mroczyński
Studies of Electrical Parameters and Thermal Stability of HiPIMS Hafnium Oxynitride (HfO x N y ) Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Dario Schiavon, Robert Mroczyński, Anna Kafar, Grzegorz Kamler, Iryna Levchenko, Stephen Najda, Piotr Perlin
Refractive Index of Heavily Germanium-Doped Gallium Nitride Measured by Spectral Reflectometry and Ellipsometry. Materials (Basel, Switzerland) 14 (23) (2021)
Andrzej Mazurak, Robert Mroczyński, David Beke, Ádám Gali
Silicon-Carbide (SiC) Nanocrystal Technology and Characterization and Its Applications in Memory Structures. Nanomaterials (Basel, Switzerland) 10 (12) (2020)

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