Myeongsu Chae

Publication Activity (10 Years)

Years Active: 2023-2023
Publications (10 Years): 1

Top Topics

Room Temperature

Top Venues

This page only lists publications with an associated author ORCID identifier.

Publications

Myeongsu Chae, Hyungtak Kim
Investigation of the Gate Degradation Induced by Forward Gate Voltage Stress in p-GaN Gate High Electron Mobility Transistors. Micromachines 14 (5) (2023)