Sandeep Kumar Chaluvadi (S K Chaluvadi)

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 12

Top Topics

Molecular Dynamics Simulations

High Efficiency

Top Venues

Materials (Basel, Switzerland)

ACS applied materials & interfaces

The journal of physical chemistry letters

This page only lists publications with an associated author ORCID identifier.

Publications

Sandeep Kumar Chaluvadi, Shyni Punathum Chalil, Anupam Jana, Deepak Dagur, Giovanni Vinai, Federico Motti, Jun Fujii, Moussa Mezhoud, Ulrike Lüders, Vincent Polewczyk, Ivana Vobornik, Giorgio Rossi, Chiara Bigi, Younghun Hwang, Thomas Olsen, Pasquale Orgiani, Federico Mazzola
Uncovering the Lowest Thickness Limit for Room-Temperature Ferromagnetism of Cr 1.6 Te 2 . Nano letters (2024)
Sandeep Kumar Chaluvadi, Shyni Punathum Chalil, Anupam Jana, Deepak Dagur, Giovanni Vinai, Federico Motti, Jun Fujii, Moussa Mezhoud, Ulrike Lüders, Vincent Polewczyk, Ivana Vobornik, Giorgio Rossi, Chiara Bigi, Younghun Hwang, Thomas Olsen, Pasquale Orgiani, Federico Mazzola
Uncovering the Lowest Thickness Limit for Room-Temperature Ferromagnetism of Cr 1.6 Te 2 . Nano letters 24 (25) (2024)
Pasquale Orgiani, Sandeep Kumar Chaluvadi, S Punathum Chalil, Federico Mazzola, Anupam Jana, S Dolabella, Piu Rajak, M Ferrara, D Benedetti, A Fondacaro, F Salvador, Regina Ciancio, Jun Fujii, Giancarlo Panaccione, Ivana Vobornik, Giorgio Rossi
Dual pulsed laser deposition system for the growth of complex materials and heterostructures. The Review of scientific instruments 94 (3) (2023)
Rubén Gracia-Abad, Soraya Sangiao, Sandeep Kumar Chaluvadi, Pasquale Orgiani, José María De Teresa
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi 2 Se 3 Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Rubén Gracia-Abad, Soraya Sangiao, Sandeep Kumar Chaluvadi, Pasquale Orgiani, José María De Teresa
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi 2 Se 3 Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Rubén Gracia-Abad, Soraya Sangiao, Sandeep Kumar Chaluvadi, Pasquale Orgiani, José María De Teresa
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi 2 Se 3 Thin Films. Materials (Basel, Switzerland) 16 (6) (2023)
Federico Mazzola, H Hassani, D Amoroso, Sandeep Kumar Chaluvadi, J Fujii, Vincent Polewczyk, Piu Rajak, Max Koegler, Regina Ciancio, B Partoens, Giorgio Rossi, Ivana Vobornik, P Ghosez, Pasquale Orgiani
Unveiling the Electronic Structure of Pseudotetragonal WO 3 Thin Films. The journal of physical chemistry letters (2023)
Federico Mazzola, Sandeep Kumar Chaluvadi, Vincent Polewczyk, Debashis Mondal, Jun Fujii, Piu Rajak, Mahabul Islam, Regina Ciancio, Luisa Barba, Michele Fabrizio, Giorgio Rossi, Pasquale Orgiani, Ivana Vobornik
Disentangling Structural and Electronic Properties in V 2 O 3 Thin Films: A Genuine Nonsymmetry Breaking Mott Transition. Nano letters 22 (14) (2022)
Sandeep Kumar Chaluvadi, Vincent Polewczyk, Aleksandr Yu Petrov, Giovanni Vinai, Luca Braglia, Jose Manuel Diez, Victor Pierron, Paolo Perna, Laurence Méchin, Piero Torelli, Pasquale Orgiani
Electronic Properties of Fully Strained La 1- x Sr x MnO 3 Thin Films Grown by Molecular Beam Epitaxy (0.15 ≤ x ≤ 0.45). ACS omega 7 (17) (2022)
Paola Di Pietro, Maryam Golalikhani, Kanishka Wijesekara, Sandeep Kumar Chaluvadi, Pasquale Orgiani, Xiaoxing Xi, Stefano Lupi, Andrea Perucchi
Spectroscopic Evidence of a Dimensionality-Induced Metal-to-Insulator Transition in the Ruddlesden-Popper Lan+1NinO3n+1 Series. ACS applied materials & interfaces 13 (5) (2021)
Piu Rajak, Daniel Knez, Sandeep Kumar Chaluvadi, Pasquale Orgiani, Giorgio Rossi, Laurence Méchin, Regina Ciancio
Evidence of Mn-Ion Structural Displacements Correlated with Oxygen Vacancies in La0.7Sr0.3MnO3 Interfacial Dead Layers. ACS applied materials & interfaces 13 (46) (2021)
Rubén Gracia-Abad, Soraya Sangiao, Chiara Bigi, Sandeep Kumar Chaluvadi, Pasquale Orgiani, José María De Teresa
Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin. Nanomaterials (Basel, Switzerland) 11 (5) (2021)