William Bertrand Doriese (W B Doriese, William B Doriese)

Scopus Author ID ResearcherID ORCID

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 4

Top Venues

The Review of scientific instruments

Sensors (Basel, Switzerland)

NIST Boulder Laboratories

Princeton University (PHD)

This page only lists publications with an associated author ORCID identifier.

Affiliation History

NIST Boulder Laboratories

United States

Physicist :: Quantum Sensors Group

Education History

Princeton University

United States

PHD :: Physics

Haverford College

United States

BSC :: Astronomy

Haverford College

United States

BSC :: Physics

Publications

Nathan Nakamura, Paul Szypryt, Amber L Dagel, Bradley K Alpert, Douglas A Bennett, William Bertrand Doriese, Malcolm Durkin, Joseph W Fowler, Dylan T Fox, Johnathon D Gard, Ryan N Goodner, James Zachariah Harris, Gene C Hilton, Edward S Jimenez, Burke L Kernen, Kurt W Larson, Zachary H Levine, Daniel McArthur, Kelsey M Morgan, Galen C O'Neil, Nathan J Ortiz, Christine G Pappas, Carl D Reintsema, Daniel R Schmidt, Peter A Schultz, Kyle R Thompson, Joel N Ullom, Leila Vale, Courtenay T Vaughan, Christopher Walker, Joel C Weber, Jason W Wheeler, Daniel S Swetz
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. Sensors (Basel, Switzerland) 24 (9) (2024)
Nathan Nakamura, Paul Szypryt, Amber L Dagel, Bradley K Alpert, Douglas A Bennett, William Bertrand Doriese, Malcolm Durkin, Joseph W Fowler, Dylan T Fox, Johnathon D Gard, Ryan N Goodner, James Zachariah Harris, Gene C Hilton, Edward S Jimenez, Burke L Kernen, Kurt W Larson, Zachary H Levine, Daniel McArthur, Kelsey M Morgan, Galen C O'Neil, Nathan J Ortiz, Christine G Pappas, Carl D Reintsema, Daniel R Schmidt, Peter A Schultz, Kyle R Thompson, Joel N Ullom, Leila Vale, Courtenay T Vaughan, Christopher Walker, Joel C Weber, Jason W Wheeler, Daniel S Swetz
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. Sensors (Basel, Switzerland) 24 (9) (2024)
Paul Szypryt, Galen C O'Neil, E Takacs, J N Tan, S W Buechele, A S Naing, Douglas A Bennett, William Bertrand Doriese, M Durkin, J W Fowler, Johnathon D Gard, G C Hilton, Kelsey M Morgan, C D Reintsema, D R Schmidt, Daniel S Swetz, J N Ullom, Yu Ralchenko
A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap. The Review of scientific instruments 90 (12) (2020)
Sang-Jun Lee, Charles James Titus, Roberto Alonso Mori, Michael L Baker, Douglas A Bennett, Hsiao-Mei Cho, William Bertrand Doriese, Joseph W Fowler, Kelly J Gaffney, Alessandro Gallo, Johnathon D Gard, Gene C Hilton, Hoyoung Jang, Young Il Joe, Christopher J Kenney, Jason Knight, Thomas Kroll, Jun-Sik Lee, Dale Li, Donghui Lu, Ronald Marks, Michael P Minitti, Kelsey M Morgan, Hirohito Ogasawara, Galen C O'Neil, Carl D Reintsema, Daniel R Schmidt, Dimosthenis Sokaras, Joel N Ullom, Tsu-Chien Weng, Christopher Williams, Betty A Young, Daniel S Swetz, Kent D Irwin, Dennis Nordlund
Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1. The Review of scientific instruments 90 (11) (2019)

William Bertrand Doriese.css-eqlu8i{font-size:small;padding-left:4px;} (W B Doriese, William B Doriese)

Publication Activity (10 Years)

Top Topics

Top Venues

William Bertrand Doriese (W B Doriese, William B Doriese)