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Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1.

Sang-Jun LeeCharles James TitusRoberto Alonso MoriMichael L BakerDouglas A BennettHsiao-Mei ChoWilliam Bertrand DorieseJoseph W FowlerKelly J GaffneyAlessandro GalloJohnathon D GardGene C HiltonHoyoung JangYoung Il JoeChristopher J KenneyJason KnightThomas KrollJun-Sik LeeDale LiDonghui LuRonald MarksMichael P MinittiKelsey M MorganHirohito OgasawaraGalen C O'NeilCarl D ReintsemaDaniel R SchmidtDimosthenis SokarasJoel N UllomTsu-Chien WengChristopher WilliamsBetty A YoungDaniel S SwetzKent D IrwinDennis Nordlund
Published in: The Review of scientific instruments (2019)
We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 × 10-3 sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented.
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