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Direct cross-sectional imaging using X-ray Compton scattering: application to commercial batteries.

Naruki TsujiKentaro KajiwaraMasayoshi ItouYoshiharu Sakurai
Published in: Journal of synchrotron radiation (2021)
A synchrotron-based technique using Compton scattering imaging is presented. This technique has been applied to a coin battery (CR2023), and the cross-sectional image has been obtained in 34 ms without sample rotation. A three-dimensional image of the whole structure has been reconstructed from 74 cross-sectional images taken consecutively by scanning the incident, wide X-ray beam along one direction. This work demonstrates that quick cross-sectional imaging of regions of interest and three-dimensional image reconstruction without sample rotation are feasible using Compton scattering imaging.
Keyphrases
  • cross sectional
  • high resolution
  • deep learning
  • magnetic resonance imaging
  • electron microscopy
  • ms ms
  • magnetic resonance
  • optical coherence tomography