IEEE transactions on instrumentation and measurement
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Publications volume 72, 2023
Eun Som Jeon , Hongjun Choi , Ankita Shukla , Yuan Wang , Matthew P Buman , Pavan Turaga
Eun Som Jeon , Hongjun Choi , Ankita Shukla , Yuan Wang , Matthew P Buman , Pavan Turaga
Eun Som Jeon , Hongjun Choi , Ankita Shukla , Yuan Wang , Matthew P Buman , Pavan Turaga
Dianlin Hu , Yikun Zhang , Wangyao Li , Weijie Zhang , Krishna Reddy , Qiaoqiao Ding , Xiaoqun Zhang , Yang Chen , Hao Gao
Dianlin Hu , Yikun Zhang , Wangyao Li , Weijie Zhang , Krishna Reddy , Qiaoqiao Ding , Xiaoqun Zhang , Yang Chen , Hao Gao
Dianlin Hu , Yikun Zhang , Wangyao Li , Weijie Zhang , Krishna Reddy , Qiaoqiao Ding , Xiaoqun Zhang , Yang Chen , Hao Gao volume 71, 2022
Behrouz Azimian , Reetam Sen Biswas , Shiva Moshtagh , Anamitra Pal , Lang Tong , Gautam Dasarathy
volume 71, 2021 volume 70, 2021
Min Gon Kim , Kai Yu , Xiaodan Niu , Bin He
Sammy A Perdomo , Viviana Ortega , Andres Jaramillo-Botero , Nelson Mancilla , Jose Hernando Mosquera-DeLaCruz , Drochss Pettry Valencia , Mauricio Quimbaya , Juan David Contreras , Gabriel Esteban Velez , Oscar A Loaiza , Adriana Gomez , Jhonattan de la Roche
volume 70, 2020
Kristin N Hageman , Margaret R Chow , Dale C Roberts , Charles C Della Santina
volume 69, number 3, 2019 volume 69, number 4, 2019 volume 69, number 5, 2019
Heyu Yin , Ehsan Ashoori , Xiaoyi Mu , Andrew J Mason volume 69, number 6, 2019
Katelyn R Brinker , Marshall Vaccaro , Reza Zoughi volume 68, number 10, 2018 volume 68, number 2, 2018
Amir Borna , Tony R Carter , Paul DeRego , Conrad D James , Peter D D Schwindt volume 68, number 9, 2018
Zhixiang Zhao , Siwei Xie , Xi Zhang , Jingwu Yang , Qiu Huang , Jianfeng Xu , Qiyu Peng
Michelle M Mellenthin , Jennifer L Mueller , Erick Dario León Bueno de Camargo , Fernando Silva de Moura , Talles Batista Rattis Santos , Raul Gonzalez Lima , Sarah J Hamilton , Peter A Muller , Melody Alsaker