Ultramicroscopy

Keyphrases

Publications

volume 264, 2024

Erich Müller, Katharina Adrion, Milena Hugenschmidt, Dagmar Gerthsen
Reaction-diffusion study of electron-beam-induced contamination growth. Ultramicroscopy 264 (2024)
K Ji, M Schnedler, Q Lan, J-F Carlin, R Butté, N Grandjean, R E Dunin-Borkowski, Ph Ebert
Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN. Ultramicroscopy 264 (2024)
Taichi Kusumi, Shun Katakami, Ryo Ishikawa, Kazuaki Kawahara, Tiarnan Mullarkey, Julie Marie Bekkevold, Jonathan J P Peters, Lewys Jones, Naoya Shibata, Masato Okada
New Poisson denoising method for pulse-count STEM imaging. Ultramicroscopy 264 (2024)
Erich Müller, Katharina Adrion, Milena Hugenschmidt, Dagmar Gerthsen
Reaction-diffusion study of electron-beam-induced contamination growth. Ultramicroscopy 264 (2024)
Jorge Luis Briseño-Gómez, Atzin López-Tercero, José Ángel Castellanos-Reyes, Alejandro Reyes-Coronado
Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation. Ultramicroscopy 264 (2024)
Taichi Kusumi, Shun Katakami, Ryo Ishikawa, Kazuaki Kawahara, Tiarnan Mullarkey, Julie Marie Bekkevold, Jonathan J P Peters, Lewys Jones, Naoya Shibata, Masato Okada
New Poisson denoising method for pulse-count STEM imaging. Ultramicroscopy 264 (2024)
Jorge Luis Briseño-Gómez, Atzin López-Tercero, José Ángel Castellanos-Reyes, Alejandro Reyes-Coronado
Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation. Ultramicroscopy 264 (2024)
K Ji, M Schnedler, Q Lan, J-F Carlin, R Butté, N Grandjean, R E Dunin-Borkowski, Ph Ebert
Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN. Ultramicroscopy 264 (2024)

volume 263, 2024

Bartosz C Pruchnik, Janusz D Fidelus, Ewelina Gacka, Krystyna Mika, Leszek Zaraska, Grzegorz D Sulka, Teodor P Gotszalk
Atomic force microscopy in mechanical measurements of single nanowires. Ultramicroscopy 263 (2024)
Xinyu Li, Longyun Chen, Sudong Kong, Haijian Zhong, Feng Jiang, Weidong Zhao
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy. Ultramicroscopy 263 (2024)
Hui Chen, Farhang Nabiei, James Badro, Duncan T L Alexander, Cécile Hébert
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data. Ultramicroscopy 263 (2024)
M Le Ster, S Pawłowski, I Lutsyk, P J Kowalczyk
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy. Ultramicroscopy 263 (2024)
Hui Chen, Farhang Nabiei, James Badro, Duncan T L Alexander, Cécile Hébert
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data. Ultramicroscopy 263 (2024)
William Bang Lomholdt, Matthew Helmi Leth Larsen, Cuauhtemoc Nuñez Valencia, Jakob Schiøtz, Thomas Willum Hansen
Interpretability of high-resolution transmission electron microscopy images. Ultramicroscopy 263 (2024)
Muhammad Touqeer, Behnam Esmaeilzadeh, Wenjie Meng, Jihao Wang, Syed Asad Maqbool, Shaofeng Zheng, Liu Junwei, Yubin Hou, Qingyou Lu
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity. Ultramicroscopy 263 (2024)
Xinyu Li, Longyun Chen, Sudong Kong, Haijian Zhong, Feng Jiang, Weidong Zhao
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy. Ultramicroscopy 263 (2024)
Muhammad Touqeer, Behnam Esmaeilzadeh, Wenjie Meng, Jihao Wang, Syed Asad Maqbool, Shaofeng Zheng, Liu Junwei, Yubin Hou, Qingyou Lu
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity. Ultramicroscopy 263 (2024)
M Le Ster, S Pawłowski, I Lutsyk, P J Kowalczyk
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy. Ultramicroscopy 263 (2024)
Bartosz C Pruchnik, Janusz D Fidelus, Ewelina Gacka, Krystyna Mika, Leszek Zaraska, Grzegorz D Sulka, Teodor P Gotszalk
Atomic force microscopy in mechanical measurements of single nanowires. Ultramicroscopy 263 (2024)
William Bang Lomholdt, Matthew Helmi Leth Larsen, Cuauhtemoc Nuñez Valencia, Jakob Schiøtz, Thomas Willum Hansen
Interpretability of high-resolution transmission electron microscopy images. Ultramicroscopy 263 (2024)

volume 262, 2024

Eliška Materna Mikmeková, Jiří Materna, Ivo Konvalina, Šárka Mikmeková, Ilona Müllerová, Tewodros Asefa
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning. Ultramicroscopy 262 (2024)
Jun Uzuhashi, Tadakatsu Ohkubo
Systematic study of FIB-induced damage for the high-quality TEM sample preparation. Ultramicroscopy 262 (2024)

Ultramicroscopy

Keyphrases

Publications

volume 267, 2024

volume 266, 2024

volume 265, 2024

volume 264, 2024

volume 263, 2024

volume 262, 2024