Journal of vacuum science and technology. B, Nanotechnology & microelectronics : materials, processing, measurement, & phenomena : JVST B
Keyphrases
Publications volume 42, number 2, 2024 volume 41, number 4, 2023 volume 41, number 1, 2022
Minghan Xian , Jenna L Stephany , Chan-Wen Chiu , Chao-Ching Chiang , Fan Ren , Cheng-Tse Tsai , Siang-Sin Shan , Yu-Te Liao , Josephine F Esquivel-Upshaw , Stephen J Pearton
Minghan Xian , Jenna L Stephany , Chan-Wen Chiu , Chao-Ching Chiang , Fan Ren , Cheng-Tse Tsai , Siang-Sin Shan , Yu-Te Liao , Josephine F Esquivel-Upshaw , Stephen J Pearton volume 40, number 2, 2022
Minghan Xian , Chan-Wen Chiu , Patrick H Carey , Chaker Fares , Liya Chen , Rena Wu , Fan Ren , Cheng-Tse Tsai , Siang-Sin Shan , Yu-Te Liao , Josephine F Esquivel-Upshaw , Stephen J Pearton
Chan-Wen Chiu , Minghan Xian , Jenna L Stephany , Xinyi Xia , Chao-Ching Chiang , Fan Ren , Cheng-Tse Tsai , Siang-Sin Shan , Yu-Te Liao , Josephine F Esquivel-Upshaw , Santosh R Rananaware , Long T Nguyen , Nicolas C Macaluso , Piyush K Jain , Melanie N Cash , Carla N Mavian , Marco Salemi , Marino E Leon , Chin-Wei Chang , Jenshan Lin , Stephen J Pearton volume 39, number 3, 2021
Minghan Xian , Hao Luo , Xinyi Xia , Chaker Fares , Patrick H Carey , Chan-Wen Chiu , Fan Ren , Siang-Sin Shan , Yu-Te Liao , Shu-Min Hsu , Josephine F Esquivel-Upshaw , Chin-Wei Chang , Jenshan Lin , Steven C Ghivizzani , Stephen J Pearton volume 39, number 6, 2021 volume 38, number 3, 2020 volume 37, number 3, 2019
Olga A Shenderova , Alexander I Shames , Nicholas A Nunn , Marco D Torelli , Igor Vlasov , Alexander Zaitsev volume 36, number 1, 2018
Vincent J Genova , David N Agyeman-Budu , Arthur R Woll volume 35, number 3, 2017
Rui Dong , Irma Kuljanishvili
volume 35, number 4, 2017
Sarmita Majumder , Karalee Jarvis , Sanjay K Banerjee , Karen L Kavanagh volume 35, number 5, 2017
Chi-Fu Yen , Sanjeevi Sivasankar volume 34, number 5, 2016
Kendra J Adams , John Daniel DeBord , Francisco Fernandez-Lima volume 33, number 3, 2015
Robert D Viveros , Alexander Liberman , William C Trogler , Andrew C Kummel volume 33, number 6, 2015
Peter G Shankles , Andrea C Timm , Mitchel J Doktycz , Scott T Retterer
Hidetatsu Miyoshi , Jun Taniguchi volume 32, number 6, 2014
Jeonghwan Kim , Dooyoung Hah , Theda Daniels-Race , Martin Feldman volume 31, number 3, 2013
Hsin-Han Lin , Wen-Hwa Chen , Franklin C-N Hong volume 31, number 6, 2013
Haogang Cai , David Depoil , Matteo Palma , Michael P Sheetz , Michael L Dustin , Shalom J Wind
Jeonghwan Kim , Kyung-Nam Kang , Anirban Sarkar , Pallavi Malempati , Dooyoung Hah , Theda Daniels-Race , Martin Feldman volume 31, number 2, 2012
Yusuke Iwai , Takayoshi Koike , Youhei Hayama , Atsuo Jouzuka , Tomonori Nakamura , Yoshihiro Onizuka , Motosuke Miyoshi , Hidenori Mimura volume 30, number 2, 2012
Robert M Taylor , Dale L Huber , Todd C Monson , Victor Esch , Laurel O Sillerud
Casey N Ta , Yuko Kono , Christopher V Barback , Robert F Mattrey , Andrew C Kummel
Casey N Ta , Alexander Liberman , H Paul Martinez , Christopher V Barback , Robert F Mattrey , Sarah L Blair , William C Trogler , Andrew C Kummel , Zhe Wu volume 30, number 6, 2012
Marian Mankos , Khashayar Shadman , Alpha T N'diaye , Andreas K Schmid , Henrik H J Persson , Ronald W Davis
Michelle J Wilson , Yaming Jiang , Bernardo Yañez-Soto , Sara Liliensiek , William L Murphy , Paul F Nealey volume 29, number 2, 2011
Kerry Wilson , Maria Stancescu , Mainak Das , John Rumsey , James Hickman volume 29, number 3, 2011
Jonilyn G Longenecker , Eric W Moore , John A Marohn volume 28, number 1, 2010
Huilan Han , Abhinav Bhushan , Frank Yaghmaie , Cristina E Davis volume 28, number 3, 2010
A Siber , R F Rajter , R H French , W Y Ching , V A Parsegian , R Podgornik volume 28, number 6, 2010
Bernadeta R Srijanto , Scott T Retterer , Jason D Fowlkes , Mitchel J Doktycz